MicroControl:Developer: Difference between revisions
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= How to scan = | = How to scan = | ||
Get and set various scan parameters | |||
== Overview Scan == | |||
Select the configuration for the fastest scan, by choosing highest speed, lowest zoom and least overlap and lowest resolution. | |||
User then selects the overview area | |||
Either by manually positioning the slide and then marking the center | |||
Or by marking top-left and botton-right positions | |||
and the corresponding focii | |||
= When to scan = | = When to scan = | ||
== Creation of a batch job == | == Creation of a batch job == | ||
Revision as of 22:57, 5 January 2011
Developer documentation
Interface and API are each defined currently for multiple functionalities. This chapter provides discussion with users and developers in mind for scope and implementation of each feature.
Acquisition settings are grouped into different use cases.
- What to scan
- How to scan
- Where to scan
- When to scan
Each part of documentation includes the description of the format of data model which is maintained aat the remote-client. XML tags and the description of the information they contain.
What to scan
Stage configuration
Purpose of this feature is to provide means for the user to interactively define 2d scan geometry.
User is expected to load the specimen / slide in the microscope and then either using remote client or directly the eye piece get the area(s) of interest in the view and click certain buttons so that client will remember those settings.
A Clickable window must be presented to show the geometry already defined. see what focus points are defined. A low resolution tiled scan is also useful for the researcher to setup points of interest.
The stage data model maintains
- Scan extents. Either defined with center a and the width and height of the image around the center, or by selecting the corners.
- Focus
- Confocal stack settings
Additionally
if using Sectioning
- x-y list of points of interest. At each selected location, it is possible to define
- Focus
- Section settings
Without Sectioning
- x-y list of points of interest. At each selected location, it is possible to define
- Focus
- Stack settings
In future the region of interest will include geometric features.
Stack configuration
How to scan
Get and set various scan parameters
Overview Scan
Select the configuration for the fastest scan, by choosing highest speed, lowest zoom and least overlap and lowest resolution. User then selects the overview area
Either by manually positioning the slide and then marking the center Or by marking top-left and botton-right positions
and the corresponding focii
