[Insight-users] SIFT/feature based registration in ITK?

[David Doria]

I see a whole bunch of intensity based registration algorithms in the
software guide, but I don't see any feature based registration. Am I missing
them? The required parts would be feature extraction, feature
correspondence, and then feature based transformation estimation.

I saw this paper:
http://www.insight-journal.org/browse/publication/207

which seems to talk about using the existing 2D SIFT, etc, but can someone
point me to where this lives/an example?

Thanks!

David
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