[Insight-users] SIFT/feature based registration in ITK?

[Luis Ibanez]

Hi David,

Your observation is correct.

ITK has a lot of support for intensity-based registration method,
but not much for feature-based methods.

This will be a prolific area for adding methods to ITK in the future.



     Luis


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On Mon, Nov 16, 2009 at 5:16 PM, David Doria <daviddoria+itk at gmail.com> wrote:
> I see a whole bunch of intensity based registration algorithms in the
> software guide, but I don't see any feature based registration. Am I missing
> them? The required parts would be feature extraction, feature
> correspondence, and then feature based transformation estimation.
>
> I saw this paper:
> http://www.insight-journal.org/browse/publication/207
>
> which seems to talk about using the existing 2D SIFT, etc, but can someone
> point me to where this lives/an example?
>
> Thanks!
>
> David
>
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